The "Center for Industrial Application of CT scanning - CIA CT: Advanced 3D scanning measurement, quality assurance and product development in industry" focuses on the industrial application of CT scanning for advanced 3D scan measurement, quality assurance and product development. The consortium acts as a national competence center in the industrial application of CT scanning and conduct research of benefit to the participating companies, Danish industry and Danish society.
The project aims to help the participating companies and Danish industry with the introduction of CT scanning as measuring equipment and help with research at the international level.
Project Responsible: Leonardo De Chiffre, Department of Mechanical Engineering, Technical University of Denmark. Duration of Project: 1st September 2009 - 31th August 2013
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Conference on
"Industrial Applications of CT Scanning - Possibilities & Challenges"
12th June 2012