Center for Industrial Application of CT scanning (CIA-CT)   

The "Center for Industrial Application of CT scanning - CIA CT: Advanced 3D scanning measurement, quality assurance and product development in industry" focuses on the industrial application of CT scanning foradvanced 3D scan measurement, quality assurance and product development. The consortium will act as a national competence center in the industrial application of CT scanning and conduct research of benefit to the participating firms, Danish industry and Danish society.

The project aims to help the participating companies and Danish industry with the introduction of CT scanning as measuring equipment and help with research at the international level.

This project  is funded by the Danish Agency for Science Technology and Innovation

Project Responsible: Leonardo De Chiffre, Department of Mechanical Engineering, Technical University of Denmark.

Duration of Project:  1st September 2009 - 31th August 2013